SEMI-AUTO GRID TOOL FOR DAF VOIDS MEASUREMENT

Authors

  • Frederick Ray I. Gomez, Nerie R. Gomez Author

Abstract

Provide specialized tool for Assembly Process Control and New Product Introduction (NPI) for measuring and/or quantifying die attach film (DAF) voids and other die attach-related defects

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Published

2018-12-30

Issue

Vol. 5 No. 12 (2018): December 2018

Section

Articles